Comparison of glancing angle extended x-ray absorption fine structure obtained from fluorescence and reflectivity measurements

Journal Article · Mon Mar 01 04:00:00 EST 1993 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.353105· OSTI ID:6990499

Chen, H; Heald, S M ^[1]

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1. Materials Science Division, Brookhaven National Laboratory, Upton, New York 11973 (United States)

At glancing angles the extended x-ray absorption fine structure (EXAFS) can be determined from either the fluorescence or reflectivity signals. This article presents a critical comparison of the two detection channels as they apply to thin film interface problems. Both signals are distorted by anomalous dispersion effects, and our previous method for correcting the distortions in the fluorescence signal is shown to work equally well for the reflectivity signal. Using results from a pure gold film and a Cu-Al bilayer as examples, it is demonstrated that both signals can be corrected to obtain accurate EXAFS information. Fluorescence detection generally offers greater sensitivity, improved signal-to-noise and less distortion of the EXAFS, but the reflectivity signal may be easier to obtain for [ital in] [ital situ] measurements. A complication for fluorescence is the possibility of an additional contribution to the signal caused by x rays scattered into the substrate layer. While generally small, this contribution is difficult to remove from the measured signal, and may make the reflectivity the preferred signal for some experiments.

• DOE Contract Number: AC02-76CH00016; AS05-80ER10742
• OSTI ID: 6990499
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 73:5; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

665300* -- Interactions Between Beams & Condensed Matter-- (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION
ALUMINIUM
COMPARATIVE EVALUATIONS
COPPER
ELEMENTS
EVALUATION
FINE STRUCTURE
FLUORESCENCE
LUMINESCENCE
METALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTIVITY
SORPTION
SPECTROSCOPY
SURFACE PROPERTIES
TRANSITION ELEMENTS
X-RAY SPECTROSCOPY