EXAFS at grazing incidence: Data collection and analysis
Conference
·
· Review of Scientific Instruments
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
Extended x-ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al bilayers as an example. A comparison of the fluorescence and reflectivity detection channels is given, along with a discussion of the methods for correction of anomalous dispersion distortions. In addition, data from a Ni-Ti multilayer is used to demonstrate the potential of enhancing the sensitivity of the EXAFS signal to selected regions using standing wave effects.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
- DOE Contract Number:
- AC02-76CH00016; AS05-80ER10742
- OSTI ID:
- 5408945
- Report Number(s):
- BNL--46401; CONF-910730--1; ON: DE91015840
- Conference Information:
- Journal Name: Review of Scientific Instruments Journal Issue: 1 Journal Volume: 63
- Country of Publication:
- United States
- Language:
- English
Similar Records
EXAFS at grazing incidence: Data collection and analysis
EXAFS studies of interfaces in bilayers and multilayers
Comparison of glancing angle extended x-ray absorption fine structure obtained from fluorescence and reflectivity measurements
Journal Article
·
Tue Dec 31 23:00:00 EST 1991
· Review of Scientific Instruments; (United States)
·
OSTI ID:5645496
EXAFS studies of interfaces in bilayers and multilayers
Conference
·
Thu Dec 31 23:00:00 EST 1987
·
OSTI ID:7082013
Comparison of glancing angle extended x-ray absorption fine structure obtained from fluorescence and reflectivity measurements
Journal Article
·
Sun Feb 28 23:00:00 EST 1993
· Journal of Applied Physics; (United States)
·
OSTI ID:6990499
Related Subjects
36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ABSORPTION SPECTRA
ALUMINIUM
DEPTH
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELEMENTS
FINE STRUCTURE
FLUORESCENCE
INTERFACES
IONIZING RADIATIONS
LUMINESCENCE
METALS
NICKEL
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATIONS
REFLECTIVITY
SAMPLE PREPARATION
SPECTRA
SURFACE PROPERTIES
TITANIUM
TRANSITION ELEMENTS
X RADIATION
X-RAY SPECTRA
360102* -- Metals & Alloys-- Structure & Phase Studies
440800 -- Miscellaneous Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
ABSORPTION SPECTRA
ALUMINIUM
DEPTH
DIMENSIONS
ELECTROMAGNETIC RADIATION
ELEMENTS
FINE STRUCTURE
FLUORESCENCE
INTERFACES
IONIZING RADIATIONS
LUMINESCENCE
METALS
NICKEL
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
RADIATIONS
REFLECTIVITY
SAMPLE PREPARATION
SPECTRA
SURFACE PROPERTIES
TITANIUM
TRANSITION ELEMENTS
X RADIATION
X-RAY SPECTRA