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EXAFS at grazing incidence: Data collection and analysis

Conference · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1142632· OSTI ID:5408945
 [1]
  1. Brookhaven National Laboratory (BNL), Upton, NY (United States)
Extended x-ray absorption fine structure (EXAFS) at grazing incidence can be applied to a large variety of surface and interface problems. This paper discusses in detail the collection and analysis of such data using interface EXAFS from metal/Al bilayers as an example. A comparison of the fluorescence and reflectivity detection channels is given, along with a discussion of the methods for correction of anomalous dispersion distortions. In addition, data from a Ni-Ti multilayer is used to demonstrate the potential of enhancing the sensitivity of the EXAFS signal to selected regions using standing wave effects.
Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE)
DOE Contract Number:
AC02-76CH00016; AS05-80ER10742
OSTI ID:
5408945
Report Number(s):
BNL--46401; CONF-910730--1; ON: DE91015840
Conference Information:
Journal Name: Review of Scientific Instruments Journal Issue: 1 Journal Volume: 63
Country of Publication:
United States
Language:
English

References (18)

Exafs from measurements of X-ray reflectivity on passivated electrodes journal December 1984
Surface Studies of Solids by Total Reflection of X-Rays journal July 1954
Glancing-angle extended x-ray-absorption fine structure and reflectivity studies of interfacial regions journal July 1988
Structural parameter determination in fluorescence EXAFS of concentrated samples journal June 1989
EXAFS and surface EXAFS from measurements of X-ray reflectivity journal April 1980
Calculation of anomalous scattering factors at arbitrary wavelengths journal August 1983
Glancing angle x-ray study of the effect of oxygen on interface reactions in Al/Ni bilayers journal May 1991
Flourescence detection of surface exafs journal June 1984
X-ray photoabsorption of solids by specular reflection journal November 1978
Metallic multilayers for x rays using classical thin-film theory journal January 1984
Anomalous Dispersion and Scattering of X-Rays journal June 1954
ReflEXAFS investigation of the local atomic structure around Fe during the oxidation of stainless steel journal April 1989
Standing-wave-assisted extended x-ray absorption fine-structure study of a Ni-Ti multilayer journal January 1989
Concentration profiling using x-ray reflectivity: Application to Cu-Al interfaces journal August 1989
EXAFS studies on superficial regions by means of total reflection journal April 1980
Comparison of glancing angle EXAFS extracted from reflectivity and fluorescence modes journal June 1989
Glancing angle EXAFS studies of Cu-Al thin film interfaces journal June 1989
A new method to extract the X-ray absorption fine structures from the reflectivity spectra : application to the study of (Ti, Nb) O2 amorphous solid solutions journal June 1989