Beam profile studies for a phase-mixed ion beam focused with a one-eighth betatron wavelength focusing cell

Journal Article · Mon May 01 00:00:00 EDT 1989 · Phys Fluids B; (United States)

DOI:https://doi.org/10.1063/1.858981· OSTI ID:6178610

Watrous, J; Ottinger, P F

The focusing properties of a one-eighth betatron wavelength focusing cell are used to determine to what extent a modification of the initial phase-space distribution of an ion beam can alter the number density profile of the beam at the focal plane. It is shown that the main modification is to alter the natural 1/r profile to include an off-axis peak. The relative difficulty with which the ion beam can be concentrated into this off-axis peak is then considered. Estimates of the source brightness (extraction ion diode source current density divided by the square of the microdivergence) required to deliver a given amount of beam current into a given annular region at the focal plane are derived.

• Research Organization: Plasma Physics Division, Plasma Technology Branch, Naval Research Laboratory, Washington, DC 20375
• OSTI ID: 6178610
• Journal Information: Phys Fluids B; (United States), Vol. 1:5
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ION BEAMS
BEAM PROFILES
BETATRONS
FOCUSING
ION SOURCES
THERMIONIC DIODES
ACCELERATORS
BEAMS
CYCLIC ACCELERATORS
DIODE TUBES
ELECTRON TUBES
THERMIONIC TUBES
700208* - Fusion Power Plant Technology- Inertial Confinement Technology