Beam profile studies for a one eighth betatron wavelength final focusing cell following phase mixed transport

Technical Report · Wed Oct 26 04:00:00 EDT 1988

OSTI ID:7078875

Watrous, J J; Ottinger, P F

The focusing properties of a one eighth betatron wavelength focusing cell are used to determine to what extent a modification of the initial phase space distribution of an ion beam can alter the number density profile of the beam at the focal plane. It is shown that the main modification is to alter the natural l/r profile to include an off-axis peak. The relative difficulty with which the ion beams can be concentrated into this off-axis peak is then considered. Estimates of the source brightness (extraction ion diode source current density divided by the square of the microdivergence) required to deliver a given amount of beam current into a given annular region at the focal plane are derived. 10 refs., 25 figs.

• Research Organization: Naval Research Lab., Washington, DC (USA)
• DOE Contract Number: AI03-79DP40092
• OSTI ID: 7078875
• Report Number(s): NRL-MR-6333; ON: DE89002508
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700208* -- Fusion Power Plant Technology-- Inertial Confinement Technology
ANGULAR MOMENTUM
BEAM DYNAMICS
BEAM PROFILES
BEAM TRANSPORT
BEAMS
BETATRON OSCILLATIONS
CONFINEMENT
CURRENT DENSITY
EFFICIENCY
FOCUSING
INERTIAL CONFINEMENT
ION BEAMS
MATHEMATICAL SPACE
OSCILLATIONS
PHASE SPACE
PLASMA CONFINEMENT
SPACE