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Lot uniformity and small sample sizes in hardness assurance

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6166305
Recent standard radiation test procedures allow wafer level lot acceptance testing using as few as 2 or 4 parts with no failures. Such tests guarantee a high survivability of accepted part only when the parts within a wafer exhibit a highly uniform response to radiation and when a large fraction of the wafers pass the test. This paper (a) points out the need for validating these tests, (b) suggests techniques for doing so and (c) recommends modifications to current test procedures.
Research Organization:
Naval Research Lab., Washington, DC (US)
OSTI ID:
6166305
Report Number(s):
CONF-880730-
Conference Information:
Journal Name: IEEE Trans. Nucl. Sci.; (United States) Journal Volume: 35:6
Country of Publication:
United States
Language:
English