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Fabrication and investigation of GaInPAs/InP heterolasers

Journal Article · · Sov. J. Quant. Electron. (Engl. Transl.); (United States)
Details of the method of fabricating GaInPAs/InP heterolasers emitting at the approx.1550 nm wavelength are given and results of an investigation of the threshold, spectral, and other characteristics of heterolasers in the 1000--1590 nm range are presented. A correlation is established between the threshold characteristics and the photon energy for GaInPAs/InP heterolasers. From the radiation spectrum and the results of x-ray microanalysis it is established that at the boundaries of the Ga/sub x/In/sub 1-x/P/sub 1-y/As/sub y//InP (x = 0.09, y = 0.2) heterojunctions there is a transition layer of variable composition which strongly influences the threshold current densities.
Research Organization:
S. U. Umaraov Physicotechnical Institute, Academy of Sciences of the Tadzhik SSR, Dushanbe
OSTI ID:
6156236
Journal Information:
Sov. J. Quant. Electron. (Engl. Transl.); (United States), Journal Name: Sov. J. Quant. Electron. (Engl. Transl.); (United States) Vol. 12:12; ISSN SJQEA
Country of Publication:
United States
Language:
English