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Efficient injection locking of an e-beam-excited XeF laser

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.329400· OSTI ID:6156117
Narrowband ultraviolet radiation from a frequency-doubled dye laser has been used to control the linewidth and polarization of a long pulse length, electron-beam-excited XeF laser. Linewidths of 0.004 nm have been achieved in the 353-nm band of the XeF B..-->..X laser transition. Over 90% of the energy in the free-running laser pulse has been extracted in the narrowband injection-locked pulse. Ratios of injection signal power to output laser power on the order of 1:5000 are adequate for efficient injection-locking to occur.
Research Organization:
Northrop Corporation, Northrop Research and Technology Center, One Research Park, Palos Verdes Peninsula, California 90274
OSTI ID:
6156117
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 52:8; ISSN JAPIA
Country of Publication:
United States
Language:
English

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