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Collection efficiency of photogenerated carriers in silicon hydride a-SiH/sub x/ MIS solar cell structures

Journal Article · · AIP Conf. Proc.; (United States)
DOI:https://doi.org/10.1063/1.33050· OSTI ID:6133471
The collection efficiency in a-SiH/sub x/ Schottky barrier solar cell structures is enhanced at short wavelengths by a thin oxide layer at the metal semiconductor interface due to reduction in diffusion of electrons from the semiconductor into the metal. Interpretation of the experimental results yields a diffusion length for holes of 0.2..mu..m and a depletion width of 0.26..mu..m.
Research Organization:
Exxon Research and Engineering Company, P.O. Box 45, Linden, N.J. 07036
OSTI ID:
6133471
Report Number(s):
CONF-810331-
Journal Information:
AIP Conf. Proc.; (United States), Journal Name: AIP Conf. Proc.; (United States) Vol. 73:1; ISSN APCPC
Country of Publication:
United States
Language:
English