Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Nature of deep acceptors in indium antimonide

Journal Article · · Sov. Phys. - Semicond. (Engl. Transl.); (United States)
OSTI ID:6125205
Samples of p- and n-type indium antimonide doped with various impurities were irradiated at room temperature with 25 MeV electrons. The temperatures dependences of the Hall coefficient and electrical resistivity were recorded in the range 4.2--300 /sup 0/K before and after irradiation. The results indicated that deep acceptors with a level at E/sub c/-0.05 eV were complexes consisting of a primary radiation defect (most probably an interstitial indium atom) and an oxygen atom. (AIP)
OSTI ID:
6125205
Journal Information:
Sov. Phys. - Semicond. (Engl. Transl.); (United States), Journal Name: Sov. Phys. - Semicond. (Engl. Transl.); (United States) Vol. 15:6; ISSN SPSEA
Country of Publication:
United States
Language:
English

Similar Records

Kinetics of changes in the carrier density in indium antimonide due to irradiation with 50 MeV electrons
Journal Article · Fri Sep 01 00:00:00 EDT 1978 · Sov. Phys. - Semicond. (Engl. Transl.); (United States) · OSTI ID:6342987

Influence of proton irradiation on properties of indium antimonide
Journal Article · Thu Jan 31 23:00:00 EST 1980 · Sov. Phys. - Semicond. (Engl. Transl.); (United States) · OSTI ID:5314412

Effects of pulsed irradiation with subthreshold-energy electrons on electrical properties of indium antimonide films
Journal Article · Sat Mar 31 23:00:00 EST 1979 · Sov. Phys. - Semicond. (Engl. Transl.); (United States) · OSTI ID:5952578