Surface structure of (22) S/Ge(111) determined by angle-resolved photoemission fine structure

Journal Article · Wed Apr 15 04:00:00 EDT 1987 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.35.5657· OSTI ID:6091154

Robey, S W; Bahr, C C; Hussain, Z; Barton, J J; Leung, K T; Lou, J; Schach von Wittenau, A E; Shirley, D A

Measurements of the extended fine structure in the photoemission intensity from the S(1s) core level were performed for a (2 x 2) overlayer of S on Ge(111). This is the first application of angle-resolved photoemission fine structure (ARPEFS) to study an adsorbate on a semiconductor substrate to our knowledge. The adsorption site and local geometry were determined from the ARPEFS with use of comparisons to multiple-scattering calculations. The results of this analysis indicate adsorption in a twofold bridge site 1.03 +- 0.05 A above the Ge surface. The separation between the first and second Ge layers is contracted by (9 +- 6)%, and some Ge: Ge bond lengths between the Ge bilayers are expanded by (8 +- 3)%. This adsorption site is different from that determined for another chalcogenide, Te, on the Ge(111) surface on the basis of surface extended x-ray-absorption fine-structure measurements, but it is the same as those found for Te/Si(111) and Se/Si(111).

• Research Organization: Materials and Molecular Research Division, Lawrence Berkeley Laboratory, University of California, Berkeley, California 94720 and Department of Physics and Department of Chemistry, University of California, Berkeley, California 94720
• OSTI ID: 6091154
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 35:11; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
360103 -- Metals & Alloys-- Mechanical Properties
656002 -- Condensed Matter Physics-- General Techniques in Condensed Matter-- (1987-)
656003 -- Condensed Matter Physics-- Interactions between Beams & Condensed Matter-- (1987-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ADSORPTION
BOND LENGTHS
CRYSTAL STRUCTURE
DATA
DIMENSIONS
ELECTRON SPECTROSCOPY
ELEMENTS
EXPERIMENTAL DATA
FINE STRUCTURE
FOURIER TRANSFORMATION
GERMANIUM
INFORMATION
INTEGRAL TRANSFORMATIONS
LAYERS
LENGTH
METALS
MULTIPLE SCATTERING
NONMETALS
NUMERICAL DATA
PHOTOELECTRON SPECTROSCOPY
SCATTERING
SORPTION
SORPTIVE PROPERTIES
SPECTROSCOPY
SULFUR
SURFACE PROPERTIES
SURFACES
TRANSFORMATIONS