Optical properties of scandium thin films

Journal Article · Sun Mar 15 04:00:00 EST 1987 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.35.3760· OSTI ID:6090534

Sigrist, M; Chassaing, G; Francois, J C; Antonangeli, F; Zema, N; Piacentini, M

A new investigation of the optical properties of scandium is presented. Near-normal-incidence reflectivity measurements were performed from 0.22 to 5.5 eV on polycrystalline thin films evaporated in situ in ultrahigh vacuum. The reflectivity, from 0.22 to 35 eV, of the same samples after they had been exposed to air was also measured. The ultraviolet reflectivity was affected by oxygen contamination and a structure around 21 eV was recognized as due to the surface oxide layer. The structures below 5 eV were assigned to pure scandium metal. The interband part of the dielectric tensor was calculated from the electron energy bands presented by Das and good agreement was found with the experimental curves.

• Research Organization: Departement de Physique du Solide, Universite de Provence, 3 Place V. Hugo, 13331 Marseille Cedex 3, France
• OSTI ID: 6090534
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 35:8; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
BREMSSTRAHLUNG
CONTAMINATION
CRYSTALS
DIELECTRIC TENSOR
ELECTROMAGNETIC RADIATION
ELEMENTS
FILMS
METALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
POLYCRYSTALS
RADIATIONS
REFLECTIVITY
SCANDIUM
SURFACE CONTAMINATION
SURFACE PROPERTIES
SYNCHROTRON RADIATION
TENSORS
THIN FILMS
TRANSITION ELEMENTS