Optical properties of {beta}-Sn films

Journal Article · Wed Apr 01 04:00:00 EDT 2009 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.3106528· OSTI ID:21190116

Takeuchi, Katsuki; Adachi, Sadao ^[1]

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1. Graduate School of Engineering, Gunma University, Kiryu-shi, Gunma 376-8515 (Japan)

Optical properties of white tin ({beta}-Sn) have been investigated using spectroscopic ellipsometry in the photon-energy range between 0.6 and 6.5 eV at room temperature. The {beta}-Sn films are deposited by vacuum evaporation on Si(001) substrates. The structural properties of the films are evaluated by x-ray diffraction and ex situ atomic force microscopy. The measured {epsilon}(E) spectra reveal distinct structures at several interband critical points in the Brillouin zone of {beta}-Sn. These spectra are analyzed on the basis of a simplified model of the interband transitions, including the free-carrier absorption between the filled and empty electronic states. Dielectric-related optical constants, such as the complex refractive index, absorption coefficient, and normal-incidence reflectivity, of bulk {beta}-Sn films are also presented.

• OSTI ID: 21190116
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 7 Vol. 105; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION
ATOMIC FORCE MICROSCOPY
BRILLOUIN ZONES
DIELECTRIC MATERIALS
ELLIPSOMETRY
ENERGY-LEVEL TRANSITIONS
EV RANGE 01-10
PHOTONS
REFLECTIVITY
REFRACTIVE INDEX
SILICON
SPECTRA
SUBSTRATES
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
TIN
VACUUM COATING
VACUUM EVAPORATION
X-RAY DIFFRACTION