Evolution of optical properties of tin film from solid to liquid studied by spectroscopic ellipsometry and ab initio calculation

Journal Article · Mon Mar 24 04:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4869722· OSTI ID:1157634

Zhang, D X; Shen, B; Zheng, Y X; Wang, S Y; Zhang, J B; Yang, S D; Zhang, R J; Chen, L Y; Wang, C Z; Ho, K M

The temperature dependent optical properties of tin film from solid to liquid were studied by spectroscopic ellipsometry and ab initio molecular dynamics simulations. The dielectric function of liquid Sn was different from solid, and an interband transition near 1.5 eV was easily observed in solid while it apparently disappeared upon melting. From the evolution of optical properties with temperature, an optical measurement to acquire the melting point by ellipsometry was presented. From first principles calculation, we show that the local structure difference in solid and liquid is responsible for this difference in the optical properties observed in experiment.

• Research Organization: Ames Laboratory (AMES), Ames, IA (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: AC02-07CH11358
• OSTI ID: 1157634
• Report Number(s): IS-J 8353
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 12 Vol. 104; ISSN APPLAB; ISSN 0003-6951
• Publisher: American Institute of Physics (AIP)
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
Optical Properties
Liquid solid interfaces
Liquid thin films
Crystal structure
Solid liquid phase transitions