Geometrical considerations in the transient ionization testing of digital logic circuits

Journal Article · Wed Dec 01 04:00:00 EST 1982 · IEEE Trans. Nucl. Sci.; (United States)

DOI:https://doi.org/10.1109/TNS.1982.4336453· OSTI ID:6089220

Johnston, A

Mechanisms are identified that can cause the transient response of digital logic circuits to depend on the logic state in which they are irradiated. Several of these mechanisms depend on surface topology, and for these cases the sensitive logic states can be determined by examining the topology. General approaches for transient radiation testing are also discussed for several MSI and LSI device technologies.

• Research Organization: Boeing Aerospace Co., Seattle, WA 98124
• OSTI ID: 6089220
• Journal Information: IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 29:6; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DIGITAL CIRCUITS
ELECTRONIC CIRCUITS
GEOMETRY
IONIZATION
IRRADIATION
LOGIC CIRCUITS
MATHEMATICS
RADIATION EFFECTS
RADIATIONS
SENSITIVITY
TESTING
TOPOLOGY
TRANSIENTS