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Effect of ion-implantation doping and heat treatment of the structural properties of GaAs epitaxial layers

Journal Article · · Inorg. Mater. (Engl. Transl.); (United States)
OSTI ID:6086396
We attempted to reveal electrically active defects of the cluster type in ion-doped films by means of selective chemical etching and to consider the influence of heat treatment on the generation and decay of these imperfections in implanted and epitaxial layers of gallium arsenide. Doping of gallium arsenide by means of ion implantation is observed to generate clusters of radiation defects, whose density reaches 10/sup 7/ cm/sup -2/. Heat treatment of both ion-implanted and epitaxial layers at 700/sup 0/C causes the clusters to decay and the carrier concentration to rise. We have discovered a correlation between the dependences of the defect density and the majority-carrier concentration at an annealing temperature of 650/sup 0/C, confirming the nature of the imperfections observed: inhomogeneities - revealed by a Spirtle solution in the form of cupola-shaped etch figures - consisting of clusters of point defects formed by gettering of impurity ions on vacancy clusters.
Research Organization:
Moscow Institute of Electronic Engineering (USSR)
OSTI ID:
6086396
Journal Information:
Inorg. Mater. (Engl. Transl.); (United States), Journal Name: Inorg. Mater. (Engl. Transl.); (United States) Vol. 24:2; ISSN INOMA
Country of Publication:
United States
Language:
English