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Microwave noise parameter measurements of a high temperature superconducting flux flow transistor

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6045557
; ; ;  [1]
  1. Wisconsin Univ., Madison, WI (United States). Dept. of Electrical and Computer Engineering
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This paper reports on the noise parameters of a HTS flux flow transistor made of TiBaCaCuO operating at 77 K and 3--5 GHz experimentally determined. It is assumed that the dominant noise mechanism of the device, which is based on an array of weak links with a magnetic control line is due to the statistical nature of flux nucleation and motion in the links. The noise parameters dictate the dependence of the noise figure on the source impedance and were calculated by measuring the noise figure with a number of different source impedances. Sensitivity analysis is used to estimate the accuracy of the measurements. The measurements indicate a minimum noise figure of less than 1 dB at 3 GHz.

OSTI ID:
6045557
Report Number(s):
CONF-900944--
Journal Information:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Vol. 27:2; ISSN IEMGA; ISSN 0018-9464
Country of Publication:
United States
Language:
English

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Related Subjects

661100 -- Classical & Quantum Mechanics-- (1992-)
665411 -- Basic Superconductivity Studies-- (1992-)
665412* -- Superconducting Devices-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CALCULATION METHODS
ELECTROMAGNETIC RADIATION
HIGH-TC SUPERCONDUCTORS
MAGNETIC FLUX
MAGNETOMETERS
MATHEMATICAL MODELS
MEASURING INSTRUMENTS
MICROWAVE RADIATION
NOISE
NUCLEAR MODELS
RADIATIONS
SEMICONDUCTOR DEVICES
SENSITIVITY ANALYSIS
SUPERCONDUCTORS
TRANSISTORS
WEAK-COUPLING MODEL