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Proton isolated In/sub 0. 2/Ga/sub 0. 8/As/GaAs strained-layer superlattice avalanche photodiode

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.96621· OSTI ID:6021541

We have fabricated the first proton isolated strained-layer superlattice (SLS) avalanche photodiode. The grown In/sub 0.2/Ga/sub 0.8/As/GaAs p/sup +/n SLS structure was bombarded outside the active region with 220 keV protons to a total dose of 1 x 10/sup 15/cm/sup -2/. These first nonoptimized devices exhibit a breakdown voltage of 23.5 V with a dark current density of 1.3 x 10/sup -3/A/cm/sup 2/ at 90% of the breakdown voltage. The isolation is stable under annealing for 10 min at 350 /sup 0/C. Uniform photoresponse is observed across the active region with two order of magnitude reduction in response occurring in the isolation region. A peak uncoated external quantum efficiency of 25% at 910 nm is observed with 10 V reverse bias and photocurrent multiplication is observed at higher bias values. These results demonstrate that proton isolation can be successfully applied to strained-layer systems and can be incorporated in useful device structures.

Research Organization:
Sandia National Laboratories, Albuquerque, New Mexico 87185
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6021541
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 48:15; ISSN APPLA
Country of Publication:
United States
Language:
English