Recent advances with quiescent power supply current (I sub DDQ ) testing at Sandia using the HP82000

Conference · Tue Jan 01 00:00:00 EST 1991

OSTI ID:6018762

Righter, A W; Leong, D J; Cox, L B

Last year at the HP82000 Users Group Meeting, Sandia National Laboratories gave a presentation on I{sub DDQ} testing. This year, we will present some advances on this testing including DUT board fixturing, external DC PMU measurement, and automatic IDD-All circuit calibration. This paper is geared more toward implementation than theory, with results presented from Sandia tests. After a brief summary I{sub DDQ} theory and testing concepts, we will describe how the break (hold state) vector and data formatting present a test vector generation concern for the HP82000. We than discuss fixturing of the DUT board for both types of I{sub DDQ} measurement, and how the continuity test and test vector generation must be taken into account. Results of a test including continuity, IDD-All and I{sub DDQ} Value measurements will be shown. Next, measurement of low current using an external PMU is discussed, including noise considerations, implementation and some test results showing nA-range measurements. We then present a method for automatic calibration of the IDD-All analog comparator circuit using RM BASIC on the HP82000, with implementation and measurement results. Finally, future directions for research in this area will be explored. 14 refs., 16 figs.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• Sponsoring Organization: USDOE; USDOE, Washington, DC (USA)
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 6018762
• Report Number(s): SAND-91-0560C; CONF-9104198-1; ON: DE91009254
• Resource Relation: Conference: 1991 international HP 82000 user group meeting, Tampa, FL (USA), 4 Apr 1991
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
47 OTHER INSTRUMENTATION
ELECTRICAL FAULTS
DETECTION
SEMICONDUCTOR DEVICES
TESTING
COMPARATOR CIRCUITS
DEFECTS
ELECTRIC CURRENTS
LOGIC CIRCUITS
MEASURING METHODS
MOS TRANSISTORS
POWER SUPPLIES
CURRENTS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
TRANSISTORS
426000* - Engineering- Components
Electron Devices & Circuits- (1990-)
440800 - Miscellaneous Instrumentation- (1990-)