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Hall effect and magnetoresistance in extrinsic piezoelectric semiconductors

Journal Article · · J. Low Temp. Phys.; (United States)
DOI:https://doi.org/10.1007/BF00681743· OSTI ID:6010401

The Hall effect and transverse magnetoresistance in extrinsic piezoelectric semiconductors such as InSb are investigated according to the scattering processes of carriers in semiconductors. These scattering processes contain the acoustic phonon scattering, the piezoelectric scattering, and the ionized-impurity scattering. The energy band structure of carriers in semiconductors is assumed to be nonparabolic. Results show that Hall angle, Hall coefficient, and transverse magnetoresistance depend strongly on the dc magnetic field and carrier density due to the energy-dependent relaxation time. Comparison with experimental data is made. It is also found that the magnetoresistance in degenerate InSb oscillates with the dc magnetic field due to the scattering of carriers with impurities in semiconductors.

Research Organization:
National Chiao Tung Univ., Hsinchu (Taiwan)
OSTI ID:
6010401
Journal Information:
J. Low Temp. Phys.; (United States), Journal Name: J. Low Temp. Phys.; (United States) Vol. 73:1-2; ISSN JLTPA
Country of Publication:
United States
Language:
English