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Fabrication and electrical characterization of 0. 55eV [ital N]-on-[ital P] InGaAs TPV devices

Conference · · AIP Conference Proceedings
OSTI ID:5986541

Results are presented on the characterization and testing of lattice-mismatched 0.55 eV InGaAs/InP thermophotovoltaic (TPV) cells. A robust cell fabrication technique amenable to high throughput production is presented. A versatile light and dark I-V set up capable of fast screening of the TPV cells and an innovative approach for screening high performance cells are presented. We also report on the effect of lattice-matched InAsP and InAlAs back surface field layers on the performance of the TPV cells. [copyright] [ital 1999 American Institute of Physics.]

OSTI ID:
5986541
Report Number(s):
CONF-981055--
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Vol. 460:1; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English