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Patterned adhesion of electrolessly deposited copper on poly(tetrafluoroethylene). [electron or X-ray irradiation]

Journal Article · · Journal of the Electrochemical Society; (United States)
DOI:https://doi.org/10.1149/1.2221638· OSTI ID:5985327
;  [1]
  1. Sandia National Labs., Albuquerque, NM (United States)
Electroless deposition of Cu on Na naphthalenide-etched poly(tetrafluoroethylene) (PTFE) leads to adherent Cu film growth through a three-step solution process involving (1) sensitization by adsorption of Sn[sup II], (2) reduction of Pd[sup II] by adsorbed Sn[sup II] to produce Pd[sup 0] nucleation sites, and (3) reduction of Cu[sup II] by formaldehyde for Cu film growth. Cu film thickness is determined by exposure time in the Cu[sup II] solution. Adhesion is determined partly by the initial Sn[sup II] sensitization step: Sn from an aqueous solution is adsorbed onto and absorbed into the rough, porous, etched surface to produce a mechanically interlocked Sn-base for the subsequent steps. Patterned deposition of adherent Cu is achieved via area-selective irradiation of the surface to produce cross-linking and, subsequently, area selective etching. This results in major differences in adhesion strength of the resultant Cu film between the irradiated and nonirradiated areas: the Cu film on nonirradiated areas is not affected by a Scotch-tape peel test while on irradiated areas XPS spectra show that the Cu film, the Sn sensitizer layer, the Pd nucleation sites, and a major fraction of the etched layer are all easily and cleanly removed. After selective peeling of the Cu film and the active layer, continuation of Cu deposition in the Cu[sup II]/HCHO solution results in Cu deposition only on the remaining Cu film. Because the Sn/Pd sensitization/nucleation steps are general, the present results apply to all metals that can be electrolessly deposited.
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5985327
Journal Information:
Journal of the Electrochemical Society; (United States), Journal Name: Journal of the Electrochemical Society; (United States) Vol. 140:6; ISSN JESOAN; ISSN 0013-4651
Country of Publication:
United States
Language:
English