Direct measurement of refractive-index dispersion using a time-delayed technique

Journal Article · Sun Mar 01 04:00:00 EST 1998 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.1148794· OSTI ID:597267

Lin, S; Wang, L; Zubrzycki, W ^[1]

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1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)

We describe a new way to measure the refractive index of dielectric materials using a time-resolved correlation method. By measuring the time delay of femtosecond pulse trains through a dielectric material, we obtain the refractive index of the material. This technique is direct, less surface sensitive, and precise to four digits. Consequently, it gives a true bulk index value. We apply this technique to measure the refractive index of fused silica, InP, and GaAs in the near infrared spectral regime. {copyright} {ital 1998 American Institute of Physics.}

• OSTI ID: 597267
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 3 Vol. 69; ISSN 0034-6748; ISSN RSINAK
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
DIELECTRIC MATERIALS
OPTICAL DISPERSION
REFRACTIVE INDEX
SILICA