Refractive index determination using an orthogonalized dispersion equation

Journal Article · Sat Jul 15 04:00:00 EDT 1989 · Appl. Opt.; (United States)

DOI:https://doi.org/10.1364/AO.28.002902· OSTI ID:5889580

Carniglia, C K; Schrader, K N; O'Connell, P A; Tuenge, S

An orthogonal form of a general three-term dispersion equation is presented which is useful for determination of the refractive index of transparent optical materials from measured spectral data. The orthogonal basis functions are dependent on the spectral range of the data and whether the spacing of the data is uniform with respect to wavelength or wavenumber. The application of the technique to the reduction of ellipsometric measurements of a single layer thin film of zirconia on a fused silica substrate is presented. The measured data were fit to a Conrady dispersion equation and to the corresponding orthogonal basis set. The convergence to the solution was an order of magnitude faster for the orthogonal form of the dispersion equation.

• Research Organization: Martin Marietta Astronautics Group, Laser Systems Technology, P.O. Box 9316, International Airport, Albuquerque, New Mexico 87119(US)
• OSTI ID: 5889580
• Journal Information: Appl. Opt.; (United States), Journal Name: Appl. Opt.; (United States) Vol. 28:14; ISSN APOPA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
CHALCOGENIDES
COATINGS
ELLIPSOMETRY
FILTERS
MEASURING METHODS
MINERALS
OPTICAL FILTERS
OPTICAL PROPERTIES
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
REFRACTIVITY
SILICA
SILICON COMPOUNDS
SILICON OXIDES
SUBSTRATES
TRANSITION ELEMENT COMPOUNDS
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES