Radiation effects in microelectronics for space instruments
Journal Article
·
· IEEE Trans. Nucl. Sci.; (United States)
The natural space radiation environment must be considered when microelectronic components are selected for use in space instruments. The designer must be concerned with damage effects due to the total accumulated doses as well as soft upsets and latchup caused by single nuclear events. Methods of estimating the importance of these problems will be discussed and treatments for them will be described.
- Research Organization:
- Gamma and Cosmic Ray, Astrophysics Branch, Naval Research Lab., Washington, DC 20375
- OSTI ID:
- 5953041
- Journal Information:
- IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. 30:1; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
Similar Records
Microcircuit radiation effects databank
Radiation effects on microelectronics in space
Survivability of spacecraft systems in space radiation
Technical Report
·
Mon Jan 31 23:00:00 EST 1983
·
OSTI ID:5505718
Radiation effects on microelectronics in space
Journal Article
·
Mon Oct 31 23:00:00 EST 1988
· Proc. IEEE; (United States)
·
OSTI ID:6256645
Survivability of spacecraft systems in space radiation
Conference
·
Mon Dec 31 23:00:00 EST 1990
· Transactions of the American Nuclear Society; (United States)
·
OSTI ID:7269448