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Microcircuit radiation effects databank

Technical Report ·
OSTI ID:5505718
Radiation test data submitted by many testers is collated to serve as a reference for engineers who are concerned with and have some knowledge of the effects of the natural radiation environment on microcircuits. Total dose damage information and single event upset cross sections, i.e., the probability of a soft error (bit flip) or of a hard error (latchup) are presented.
Research Organization:
National Aeronautics and Space Administration, Greenbelt, MD (USA). Goddard Space Flight Center
OSTI ID:
5505718
Report Number(s):
N-8327903; NASA-TM-85346
Country of Publication:
United States
Language:
English

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Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
99 GENERAL AND MISCELLANEOUS
990300 -- Information Handling
BACKGROUND RADIATION
DOSES
INFORMATION SYSTEMS
MICROELECTRONICS
RADIATION DOSES
RADIATION EFFECTS
RADIATIONS