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U.S. Department of Energy
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Femtosecond studies of surface electron transfer process at semiconductor interfaces

Technical Report ·
OSTI ID:5939738
The primary focus of this research was to develop new spectroscopies applicable to the study of carrier dynamics at semiconductor surfaces. The progress made during the tenure of this grant includes the development of three novel techniques for surface studies: Surface Restricted Transient Grating Spectroscopy, Surface Acoustic Wave (SAW) spectroscopy, and Surface Space-charge Electro-optic Sampling. Further, these techniques were then applied to the study of carrier dynamics at n-TiO{sub 2} and n-GaAs interfaces. The primary results were that hole carrier reaction dynamics at TiO{sub 2} surfaces involves thermalized hole carriers at the surface on 100 psec time scales. A large effective hole mass of TiO{sub 2} is found m{sub h} greater than 3m{sub e} which negates any possibility of hot hole transfer. In contrast, the studies at n-GaAs (100) surfaces found hole carrier transfer to be faster than 30 psec and appears to be direct, without the intermediacy of surface states. The hole carrier transport to the surface is found to be faster than 300 fsec and approaches the ballistic limit for transport. Therefore, the hole carriers do arrive with large amounts of excess energy at the surface. These results indicate that at least some fraction of the hole carriers are transferring unthermalized. The importance of this in solar energy collection is that this work supports, at least from a fundamental standpoint, the possibility of exploiting hot carriers to avoid thermal energy loss mechanisms and enhance conversion efficiency. These studies are the first to provide direct time resolved (not diffusion limited) studies of surface reaction dynamics. In addition, the approach provides the highest possible resolution for studying surface reactions in the time domain. The specific results for both TiO{sub 2} and GaAs surface will be discussed below. 32 refs., 1 fig.
Research Organization:
Rochester Univ., NY (USA)
Sponsoring Organization:
DOE; USDOE, Washington, DC (USA)
DOE Contract Number:
FG02-85ER13455
OSTI ID:
5939738
Report Number(s):
DOE/ER/13455-4; ON: DE91010914
Country of Publication:
United States
Language:
English