Linear IC SPICE macromodel developed from measured transistor parameters [Book Chapter]

Conference · Tue Aug 06 00:00:00 EDT 2002 · [1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems

DOI:https://doi.org/10.1109/mwscas.1991.252089· OSTI ID:5937866

Raney, Carolyn W. ^[1]

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1. Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

A transistor level model in a subcircuit definition is presented for the L161 micropower comparator. This macromodel is suitable for use with present-day circuit simulators such as PSPICE and SPICE-2G6. Wherever possible, measured transistor parameter values are used to replace default values in the models. Limitations of the macromodel and a comparison of model performance with data sheet values will be discussed.

• Research Organization: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5937866
• Report Number(s): SAND--91-0423C; CONF-9105169--2; ON: DE91011950; ISBN: 0-7803-0620-1
• Journal Information: [1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems, Journal Name: [1991] Proceedings of the 34th Midwest Symposium on Circuits and Systems
• Publisher: IEEE
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
COMPARATOR CIRCUITS
COMPUTERIZED SIMULATION
ELECTRONIC CIRCUITS
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
PERFORMANCE
SEMICONDUCTOR DEVICES
SIMULATION
TRANSISTORS