Recent advancements in high intensity heavy negative ion sources based on the sputter principle

Conference · Sun Jan 01 04:00:00 EST 1989

OSTI ID:5891948

Alton, G D

Significant advancements have been recently made in the technology of forming high intensity heavy negative ion beams. Due to their ease of operation, simplicity, long lifetime, and wide range of species capabilities, negative ion sources predicated on the sputter principle are being used for an increasing number of diverse applications, including standard tandem accelerator-based research, high-energy ion implantation, tandem accelerator mass spectrometry, and low-energy atomic physics research. Sources have been developed which utilize either direct surface ionization, or a plasma to form the positive ion beam used to effect sputtering of samples containing the material of interest. This article will include a brief review of the fundamental processes underlying negative ion formation in these sources. Emphasis will be placed on the descriptions and performance characteristics of specific sources based on each of the positive ion formation techniques. 21 refs., 16 figs., 1 tab.

• Research Organization: Oak Ridge National Lab., TN (USA)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 5891948
• Report Number(s): CONF-8905141-3; ON: DE89012503
• Country of Publication: United States
• Language: English

Related Subjects

640301* -- Atomic
Molecular & Chemical Physics-- Beams & their Reactions
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ANGULAR DISTRIBUTION
ANIONS
BEAM EMITTANCE
CESIUM IONS
CHARGED PARTICLES
DISTRIBUTION
DISTRIBUTION FUNCTIONS
FUNCTIONS
ION SOURCES
IONIZATION
IONS
MOLYBDENUM IONS
SPUTTERING
SURFACE PROPERTIES