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Temperature dependence of the threshold current for InGaAlP visible laser diodes

Journal Article · · IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (USA)
DOI:https://doi.org/10.1109/3.73537· OSTI ID:5883280
; ; ; ;  [1]
  1. Research and Development Center, Toshiba Corp., Saiwai-ku, Kawasaki 210 (JP)
The temperature dependence of the threshold current for InGaAlP visible light laser diodes is investigated from the aspect of gain-current characteristics. The cavity length dependence of light output power versus current characteristic was evaluated for a 40 {mu}m width InGaP-InBaAlP broad-stripe laser in the temperature range between {minus} 70 and 90{degrees} C, which had about a 670 nm oscillation wavelength at room temperature. The threshold-current density dependence on the cavity length shows that a linear-gain approximation is suitable for this system. A minimum threshold-current density at 860 A/cm{sup 2} was achieved at room temperature with a cavity length of 1160 {mu}m, which is the lowest value ever reported for this material. The linear-gain parameters {beta} and {ital J}{sub 0} depended on the temperature with the characteristic temperature of about 200 K, which is considered to be the intrinsic characteristic temperature of the threshold current for this active-layer material. The internal quantum efficiency, derived from the cavity length dependence of the differential quantum efficiency, decreased in the temperature range higher than {minus}10{degrees} C, which affected the excess threshold-current increase and the decrease in the characteristic temperature at this temperature range. The theoretical calculation, considering a one-dimensional band structure model, showed that this excess increase of the threshold current was found to be attributed to the electron overflow current into the p-type cladding layer.
OSTI ID:
5883280
Journal Information:
IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Journal of Quantum Electronics (Institute of Electrical and Electronics Engineers); (USA) Vol. 27:1; ISSN 0018-9197; ISSN IEJQA
Country of Publication:
United States
Language:
English