Hardness assurance for neutron-induced displacement effects in semiconductor devices. Final report
Technical Report
·
OSTI ID:5853183
The objective of this program phase was to provide an effective means of purchasing semiconductor devices whose neutron-induced response is within known and acceptable limits. The scope of the effort was limited to those procedures for the neutron environment for bipolar transistors, temperature-compensated reference diodes, TTL(54/74) series digital integrated circuits, 741-type operational amplifiers and junction field effects transistors(JFET's). This final report covers the method by which the program objectives were met and provides background information for the companion document 'Hardness Assurance Guidelines for Displacement Effects for Bipolar Devices' (HDL-CR-78-135-1). Specifically this final report covers background lot sample statistical methods, assesses existing CRIC experimental neutron device data, and provides the background rationale for the selection of the Hardness Assurance controls.
- Research Organization:
- IRT Corp., San Diego, CA (USA)
- OSTI ID:
- 5853183
- Report Number(s):
- AD-A-065162
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMPLIFIERS
BARYONS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
ELEMENTARY PARTICLES
FERMIONS
FIELD EFFECT TRANSISTORS
HADRONS
HARDENING
INTEGRATED CIRCUITS
MATHEMATICS
MICROELECTRONIC CIRCUITS
NEUTRONS
NUCLEONS
OPERATIONAL AMPLIFIERS
PHYSICAL RADIATION EFFECTS
QUALITY ASSURANCE
RADIATION EFFECTS
RADIATION HARDENING
REGRESSION ANALYSIS
SEMICONDUCTOR DEVICES
STATISTICS
TRANSISTORS
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMPLIFIERS
BARYONS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
ELEMENTARY PARTICLES
FERMIONS
FIELD EFFECT TRANSISTORS
HADRONS
HARDENING
INTEGRATED CIRCUITS
MATHEMATICS
MICROELECTRONIC CIRCUITS
NEUTRONS
NUCLEONS
OPERATIONAL AMPLIFIERS
PHYSICAL RADIATION EFFECTS
QUALITY ASSURANCE
RADIATION EFFECTS
RADIATION HARDENING
REGRESSION ANALYSIS
SEMICONDUCTOR DEVICES
STATISTICS
TRANSISTORS