Neutron hardness assurance guidelines for semiconductor devices. Contractor report for period ending July 1979

Technical Report · Sat Sep 01 04:00:00 EDT 1979

OSTI ID:5514844

Berger, R A

This guideline document develops a systematic approach to guarantee system survival at some specified probability of survival and neutron environmental level. The approach is analogous to a filtering process in which increasingly complex and costly levels of effort are applied until all system piece-parts have acceptable probabilities of survival. Branch decisions in the procedure are based on a statistical evaluation of manufacturer-to-manufacturer and lot-to-lot variations in piece-part neutron responses. Hardness assurance is part of the total quality assurance effort and includes all control, monitoring, and evaluation efforts needed to procure systems whose nuclear hardness equals or exceeds that of the design-hardened engineering prototype throughout production and system life. Hardness assurance efforts during the production phase are made part of the piece-part procurement specification. Example procurement specifications are given in this document for bipolar transistors, diodes, transistor-transistor logic integrated circuits, operational amplifiers (101A, 741, and 108A types), and junction-field effect transistors.

• Research Organization: Mission Research Corp., La Jolla, CA (USA)
• OSTI ID: 5514844
• Report Number(s): AD-A-074882/2
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BARYONS
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
FERMIONS
FIELD EFFECT TRANSISTORS
HADRONS
HARDENING
INTEGRATED CIRCUITS
JUNCTION TRANSISTORS
LOGIC CIRCUITS
MICROELECTRONIC CIRCUITS
NEUTRONS
NUCLEONS
PHYSICAL RADIATION EFFECTS
QUALITY ASSURANCE
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SPECIFICATIONS
TRANSISTORS