Single-event burnout of power bipolar junction transistors
Conference
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5825989
- Naval Weapons Support Center, Crane, IN (United States)
- Arizona Univ., Tucson, AZ (United States). Dept. of Electrical and Computer Engineering
Experimental evidence of single-event burnout of power bipolar junctions transistors (BJTs) is reported for the first time. Several commercial power BJTs were characterized in a simulated cosmic ray environment using mono-energetic ions at the tandem Van de Graaff accelerator facility at Brookhaven National Laboratory. Most of the device types exposed to this simulated environment exhibited burnout behavior. In this paper the experimental technique, data, and results are presented, while a qualitative model is used to help explain those results and trends observed in this experiment.
- OSTI ID:
- 5825989
- Report Number(s):
- CONF-910751--
- Journal Information:
- IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:6; ISSN 0018-9499; ISSN IETNA
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACCELERATORS
BNL
BURNOUT
CHARGED PARTICLES
COMMERCIAL SECTOR
COSMIC RADIATION
DATA
ELECTROSTATIC ACCELERATORS
EXPERIMENTAL DATA
INFORMATION
IONIZING RADIATIONS
IONS
JUNCTION TRANSISTORS
MATHEMATICAL MODELS
NATIONAL ORGANIZATIONS
NUMERICAL DATA
RADIATION EFFECTS
RADIATIONS
SEMICONDUCTOR DEVICES
SIMULATION
TRANSISTORS
US AEC
US DOE
US ERDA
US ORGANIZATIONS
VAN DE GRAAFF ACCELERATORS
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ACCELERATORS
BNL
BURNOUT
CHARGED PARTICLES
COMMERCIAL SECTOR
COSMIC RADIATION
DATA
ELECTROSTATIC ACCELERATORS
EXPERIMENTAL DATA
INFORMATION
IONIZING RADIATIONS
IONS
JUNCTION TRANSISTORS
MATHEMATICAL MODELS
NATIONAL ORGANIZATIONS
NUMERICAL DATA
RADIATION EFFECTS
RADIATIONS
SEMICONDUCTOR DEVICES
SIMULATION
TRANSISTORS
US AEC
US DOE
US ERDA
US ORGANIZATIONS
VAN DE GRAAFF ACCELERATORS