Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination

Journal Article · Tue Sep 01 00:00:00 EDT 1981 · Proc. Natl. Acad. Sci. U.S.A.; (United States)

DOI:https://doi.org/10.1073/pnas.78.9.5293· OSTI ID:5821316

Hussain, Z ^[1]; Shirley, D A; Li, C H; Tong, S Y

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1. Lawrence Berkeley Lab., Berkeley, CA

A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate-substrate normal interlayer distances. Applications are demonstrated, using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers can be determined with an accuracy of better than 3%.

• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5821316
• Journal Information: Proc. Natl. Acad. Sci. U.S.A.; (United States), Vol. 78:9
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ELECTRON DIFFRACTION
FOURIER ANALYSIS
NICKEL
SELENIUM
FOURIER TRANSFORMATION
MOLECULAR STRUCTURE
SCATTERING
SURFACE PROPERTIES
COHERENT SCATTERING
DIFFRACTION
ELEMENTS
INTEGRAL TRANSFORMATIONS
METALS
SEMIMETALS
TRANSFORMATIONS
TRANSITION ELEMENTS
360104* - Metals & Alloys- Physical Properties