Fourier-transform analysis of normal photoelectron diffraction data for surface-structure determination
Journal Article
·
· Proceedings of the National Academy of Sciences of the United States of America
A direct method for surface-structure determination from normal emission photoelectron diffraction (NPD) data is presented. Fourier transforms of the calculated NPD intensities yield peaks at adsorbate-substrate normal interlayer distances. Applications are demonstrated using theoretical NPD curves for the Se/Ni system calculated by dynamical theory. These results show that interplanar spacings between the overlayer and as many as four substrate layers could be determined with an accuracy of better than 2%.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 1082166
- Report Number(s):
- LBL-11686
- Journal Information:
- Proceedings of the National Academy of Sciences of the United States of America, Vol. 78, Issue 9; ISSN 0027-8424
- Publisher:
- National Academy of Sciences, Washington, DC (United States)
- Country of Publication:
- United States
- Language:
- English
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