Normal photoelectron diffraction of c(2 x 2)O(1s)-Ni(001) and c(2 x 2)S(2p)-Ni(001),with Fourier-transform analysis

Journal Article · Wed Apr 15 00:00:00 EST 1981 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.23.3828· OSTI ID:6544863

Rosenblatt, D H; Tobin, J G; Mason, M G; Davis, R F; Kevan, S D; Shirley, D A; Li, C H; Tong, S Y

Normal photoelectron diffraction was used to study the structure of the c(2 x 2)O and c(2 x 2)S overlayers on Ni(001). The oxygen and sulfur atoms were found to lie above the fourfold hollow sites in the Ni(001) surface with d/sub perpendicular/ spacings of 0.90 +- 0.04 and 1.30 +- 0.04 A, respectively, where d/sub perpendicular/ is the perpendicular interplanar spacing between the adsorbate and surface layers. A Fourier-transform analysis was carried out on the experimental data. In both cases, the modulus of the Fourier transforms gave two large peaks in the real-space distribution function. The maxima of these peaks closely corresponded to d/sub perpendicular/+b and d/sub perpendicular/+2b, where b is the interlayer spacing in Ni(001). The range of experimental data in k space was not large enough to yield the value of d/sub perpendicular/ directly.

• Research Organization: Materials and Molecular Research Division, Lawrence Berkeley Laboratory, Berkeley, California 94720
• OSTI ID: 6544863
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Vol. 23:8
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
NICKEL
PHOTOELECTRON SPECTROSCOPY
OXYGEN
CHEMISORPTION
SULFUR
ELECTRONIC STRUCTURE
FOURIER ANALYSIS
PHOTOEMISSION
CHEMICAL REACTIONS
ELECTRON SPECTROSCOPY
ELEMENTS
EMISSION
METALS
NONMETALS
SECONDARY EMISSION
SEPARATION PROCESSES
SORPTION
SPECTROSCOPY
TRANSITION ELEMENTS
360104* - Metals & Alloys- Physical Properties