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Low energy X-ray spectra measured with a mercuric iodide energy dispersive spectrometer in a scanning electron microscope

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:5810163

A mercuric iodide energy dispersive x-ray spectrometer, with Peltier cooling provided for the detector and input field effect transistor, has been developed and tested in a scanning electron microscope. X-ray spectra were obtained with the 15 keV electron beam. An energy resolution of 225 eV (FWHM) for Mn-K..cap alpha.. at 5.9 keV and 195 eV (FWHM) for Mg-K line at 1.25 keV has been measured. Overall system noise level was 175 eV (FWHM). The detector system characterization with a carbon target demonstrated good energy sensitivity at low energies and lack of significant spectral artifacts at higher energies.

Research Organization:
Univ. of Southern California, Inst. of Physics, 4676 Admiralty Way, Suite 932, Marina del Rey, CA 90292
OSTI ID:
5810163
Report Number(s):
CONF-851009-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Journal Name: IEEE Trans. Nucl. Sci.; (United States) Vol. NS-33:1; ISSN IETNA
Country of Publication:
United States
Language:
English