First use of a mercuric iodide (HgI/sub 2/) energy dispersive x-ray detector in a scanning electron microscope

Journal Article · Sat Dec 31 23:00:00 EST 1983 · Scanning Electron Microsc.; (United States)

OSTI ID:5130856

Iwanczyk, J S; Dabrowski, A J; Huth, G C; Bradley, J G; Conley, J M; Albee, A L

A room temperature mercuric iodide x-ray detector system with a Peltier cooled field effect transistor and pulsed optical feedback preamplifier has been constructed and tested in a scanning electron microscope. The initial system achieved an energy resolution of 220 eV (FWHM) for Mg-K line at 1.25 keV and 360 eV for Mn-K..cap alpha.. at 5.9 keV. This resolution is adequate for many applications. Improved energy resolution and low energy sensitivity should be readily achievable through simple changes to the not-optimized system tested.

• Research Organization: Univ. of Southern California, Marina del Rey
• DOE Contract Number: AM03-76SF00113
• OSTI ID: 5130856
• Journal Information: Scanning Electron Microsc.; (United States), Journal Name: Scanning Electron Microsc.; (United States); ISSN SEMYB
• Country of Publication: United States
• Language: English

Related Subjects

440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
DETECTION
ELECTRON MICROSCOPY
ENERGY RESOLUTION
HGI2 SEMICONDUCTOR DETECTORS
MEASURING INSTRUMENTS
MICROSCOPY
PERFORMANCE
RADIATION DETECTION
RADIATION DETECTORS
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SEMICONDUCTOR DETECTORS
X-RAY DETECTION