Angle resolved resonant raman Auger spectroscopy of the Xe 4p{r_arrow}6p transition
- Physics Department, Western Michigan University, Kalamazoo, Michigan 49008 (United States)
- Chemistry Department, University of Nevada, Las Vegas, Nevada 89154-4003 (United States)
- Lawrence Berkeley National Laboratory, Advanced Light Source, Mail Stop 2-400, Berkeley, California 94720 (United States)
We studied the angular distributions and decay rates of the Xe 4d{sub 5/2}{r_arrow}6p resonant Auger lines using the high resolution and high flux of undulator beamline 9.0.1 at the Advanced Light Source. The electron spectra were recorded by two time-of-flight (TOF) spectrometers with energy resolutions as low as to 43 meV. This made it possible to determine the angular distribution parameters {beta} of almost all possible final ionic 5p{sup 4}({sup 3}P,{sup 1}D,{sup 1}S)6p states. A variation of the {beta} parameter in an energy scan over the resonance shows evidence for a possible interference of the resonant with the nonresonant path way to the 5p{sup 4}({sup 3}P)6p({sup 2}P{sub 3/2}) final state. {copyright} {ital 1997 American Institute of Physics.}
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- FG02-92ER14299
- OSTI ID:
- 580030
- Report Number(s):
- CONF-961110--
- Journal Information:
- AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 392; ISSN APCPCS; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
Similar Records
High resolution study of Ar 2p {r_arrow} ns, d resonant Auger transitions using the Auger resonant Raman effect
Auger resonant Raman spectroscopy used to study the angular distributions of the Xe 4{ital d}{sub 5/2}{r_arrow}6{ital p} decay spectrum