Angle resolved high resolution studies of the Xe 4d{sub 5/2} {r_arrow} 6p resonance

Journal Article · Wed May 01 00:00:00 EDT 1996 · Bulletin of the American Physical Society

OSTI ID:394261

Farhat, A; Langer, B; Berrah, N; Hemmers, O ^[1]; Bozek, J D ^[2]

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1. Univ. of Nevada, Las Vegas, NV (United States)
2. Lawrence Berkeley National Lab., CA (United States)

The Auger resonant Raman effect has been used as a method to eliminate the natural lifetime broadening in resonant Auger Spectra. The authors have coupled this method for the first time with high resolution from the ALS to study angular distributions and decay rates of the Xe 4d{sub 5/2} {r_arrow} 6p resonant Auger lines. The angular distribution parameters {beta} of almost all possible final ionic 5p{sup 4}({sup 3}P,D,S)6p states have been determined. The authors` data, which remove the discrepancy between previous lower-resolution experimental results, are compared to different theoretical results.

• DOE Contract Number: FG02-92ER14299
• OSTI ID: 394261
• Report Number(s): CONF-9605105--
• Journal Information: Bulletin of the American Physical Society, Journal Name: Bulletin of the American Physical Society Journal Issue: 3 Vol. 41; ISSN 0003-0503; ISSN BAPSA6
• Country of Publication: United States
• Language: English

Related Subjects

66 PHYSICS
ANGULAR DISTRIBUTION
AUGER ELECTRON SPECTROSCOPY
DECAY AMPLITUDES
EXCITED STATES
RAMAN EFFECT
XENON