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Formation of supersaturated alloys by ion implantation and pulsed-laser annealing

Technical Report ·
OSTI ID:5796395
Supersaturated substitutional alloys formed by ion implantation and rapid liquid-phase epitaxial regrowth induced by pulsed-laser annealing have been studied using Rutherford-backscattering and ion-channeling analysis. A series of impurities (As, Sb, Bi, Ga, In, Fe, Zn, Cu) have been implanted into single-crystal (001) orientation silicon at doses ranging from 1 x 10/sup 15//cm/sup 2/ to 1 x 10/sup 17//cm/sup 2/. The samples were subsequently annealed with a Q-switched ruby laser (energy density approx. 1.5 J/cm/sup 2/, pulse duration 15 x 10/sup -9/ sec). Ion-channeling analysis shows that laser annealing incorporates (Ga, In) and (As, Sb, Bi) impurities into substitutional lattice sites at concentrations far in excess of the equilibrium solid solubility. Channeling measurements indicate the silicon crystal is essentially defect free after laser annealing.
Research Organization:
North Texas State Univ., Denton (USA)
DOE Contract Number:
EY-76-C-05-0033
OSTI ID:
5796395
Report Number(s):
ORO-0033-T1
Country of Publication:
United States
Language:
English