Hydrogen and deuterium profiling in polymers using light and heavy ion elastic recoil detection
Silicon and helium elastic recoil detection (ERD) have been used to obtain concentration versus depth profiles of hydrogen (/sup 1/H) and deuterium (/sup 2/H) in polymers. Using helium ERD, a depth resolution of 100nm was achieved in polystyrene, whereas 30nm was achieved using silicon ERD. Polymers are in general susceptible to radiation damage and precautions are necessary in order to minimize this. These precautions are addressed. When helium ERD is used to obtain the yield versus energy profile, the conversion of this profile to one of concentration versus depth is relatively straightforward since the scattering cross sections for collisions between helium and /sup 1/H or /sup 2/H nuclei are independent of energy over typical incident energy ranges (2.3--3.0 MeV) used in these studies. With the use of silicon ions, corrections for the energy dependence of the scattering cross section must also be made. A comparison of helium ERD measurements of diffusion in polymer systems is made with those obtained using other techniques. The agreement is excellent. 31 refs., 10 figs., 2 tabs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5776967
- Report Number(s):
- SAND-89-1208C; CONF-8906186-3; ON: DE89015887
- Country of Publication:
- United States
- Language:
- English
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360605* -- Materials-- Radiation Effects
440300 -- Miscellaneous Instruments-- (-1989)
47 OTHER INSTRUMENTATION
CHARGED PARTICLES
DEUTERIUM
DIFFUSION
ELEMENTS
ESTERS
HYDROGEN
HYDROGEN ISOTOPES
IONS
ISOTOPES
LIGHT NUCLEI
MATERIALS
MEASURING INSTRUMENTS
NONMETALS
NUCLEI
ODD-ODD NUCLEI
ORGANIC COMPOUNDS
ORGANIC POLYMERS
PETROCHEMICALS
PETROLEUM PRODUCTS
PLASTICS
PMMA
POLYACRYLATES
POLYMERS
POLYOLEFINS
POLYSTYRENE
POLYVINYLS
RADIATION EFFECTS
SCATTERING
SILICON IONS
STABLE ISOTOPES
SYNTHETIC MATERIALS