Implementing QML for radiation hardness assurance

Conference · Sat Dec 01 00:00:00 EST 1990 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)

DOI:https://doi.org/10.1109/23.101193· OSTI ID:5767713

Winokur, P S; Sexton, F W; Fleetwood, D M; Terry, M D; Shaneyfelt, M R; Dressendorfer, P V; Schwank, J R ^[1]

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1. Sandia National Labs., Albuquerque, NM (USA)

Statistical process control (SPC) of technology parameters relevant to radiation hardness, test structure to IC correlation, and extrapolation from laboratory to threat scenarios are keys to implementing QML for radiation hardness assurance {ital in a cost-effective manner}. Data from approximately 300 wafer lots fabricated in a 4/3-{mu}m and CMOS IIIA (2-{mu}m) technologies are used to demonstrate approaches to, and highlight issues associated with, implementing QML for radiation-hardened CMOS in space applications. An approach is demonstrated to implement QML for single-event upset (SEU) immunity on 16 k SRAMs that involves relating values of feedback resistance to system error rates.

• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5767713
• Report Number(s): CONF-900723-; CODEN: IETNA; TRN: 91-014915
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Vol. 37:6; Conference: 27. IEEE annual conference on nuclear and space radiation effects, Reno, NV (USA), 16-20 Jul 1990; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
42 ENGINEERING
INTEGRATED CIRCUITS
PHYSICAL RADIATION EFFECTS
TRANSISTORS
COMPUTER CODES
COST
DESIGN
DOSE RATES
ERRORS
EXTRAPOLATION
FABRICATION
FEEDBACK
RADIATION HARDENING
RESISTORS
SANDIA LABORATORIES
SIMULATION
SPACE
TOLERANCE
ELECTRICAL EQUIPMENT
ELECTRONIC CIRCUITS
EQUIPMENT
HARDENING
MICROELECTRONIC CIRCUITS
NATIONAL ORGANIZATIONS
NUMERICAL SOLUTION
RADIATION EFFECTS
SEMICONDUCTOR DEVICES
US AEC
US DOE
US ERDA
US ORGANIZATIONS
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems
426000 - Engineering- Components
Electron Devices & Circuits- (1990-)