Implementing QML for radiation hardness assurance

Conference · Fri Nov 30 23:00:00 EST 1990 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)

DOI:https://doi.org/10.1109/23.101193· OSTI ID:5767713

Winokur, P S; Sexton, F W; Fleetwood, D M; Terry, M D; Shaneyfelt, M R; Dressendorfer, P V; Schwank, J R ^[1]

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1. Sandia National Labs., Albuquerque, NM (USA)

Statistical process control (SPC) of technology parameters relevant to radiation hardness, test structure to IC correlation, and extrapolation from laboratory to threat scenarios are keys to implementing QML for radiation hardness assurance {ital in a cost-effective manner}. Data from approximately 300 wafer lots fabricated in a 4/3-{mu}m and CMOS IIIA (2-{mu}m) technologies are used to demonstrate approaches to, and highlight issues associated with, implementing QML for radiation-hardened CMOS in space applications. An approach is demonstrated to implement QML for single-event upset (SEU) immunity on 16 k SRAMs that involves relating values of feedback resistance to system error rates.

• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5767713
• Report Number(s): CONF-900723--
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) Vol. 37:6; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPUTER CODES
COST
DESIGN
DOSE RATES
ELECTRICAL EQUIPMENT
ELECTRONIC CIRCUITS
EQUIPMENT
ERRORS
EXTRAPOLATION
FABRICATION
FEEDBACK
HARDENING
INTEGRATED CIRCUITS
MICROELECTRONIC CIRCUITS
NATIONAL ORGANIZATIONS
NUMERICAL SOLUTION
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RESISTORS
SANDIA LABORATORIES
SEMICONDUCTOR DEVICES
SIMULATION
SPACE
TOLERANCE
TRANSISTORS
US AEC
US DOE
US ERDA
US ORGANIZATIONS