Implementing QML (Qualified Manufacturers List) for radiation hardness assurance

Conference · Mon Jan 01 04:00:00 EST 1990

OSTI ID:6727928

Winokur, P S; Sexton, F W; Fleetwood, D M; Terry, M D; Shaneyfelt, M R; Dressendorfer, P V; Schwank, J R

Statistical process control (SPC) of technology parameters relevant to radiation hardness, test structure to Integrated Circuit (IC) correlation, and extrapolation from laboratory to threat scenarios are keys to implementing Qualified Manufacture's List (QML) for radiation hardness assurance in a cost-effective manner. Data from approximately 300 wafer lots fabricated in Sandia's 4/3-{mu}m and Complementry Metal Oxide Semiconductor (CMOS) IIIA (2-{mu}m) technologies are used to demonstrate approaches to, and highlight issues associated with, implementing QML for radiation-hardened CMOS in space applications. An approach is demonstrated to implement QML for signal-event upset SEU immunity on 16k SRAMs that involves relating values of feedback resistance to system error rates. It is seen that the process capability indices, C{sub p} and C{sub pk}, for the manufacture of 400 k{Omega} feedback resistors required to provide SEU tolerance do not conform to 6{sigma}'' quality standards. For total-dose, {triangle}V{sub it} shifts measured on transistors are correlated with circuit response in the space environment. SPC is illustrated for {triangle}V{sub it}, and violations of SPC rules are interpreted in terms of continuous improvement. Finally, design validation for SEU, and quality conformance inspections for total-dose, are identified as major obstacles to cost-effective QML implementation. Techniques and tools that will help QML provide real cost savings are identified as physical models, three-dimensional device-plus-circuit codes, and improved design simulators. 29 refs., 10 figs., 1 tab.

• Research Organization: Sandia National Labs., Albuquerque, NM (USA)
• Sponsoring Organization: DOD; DOE/DP
• DOE Contract Number: AC04-76DP00789
• OSTI ID: 6727928
• Report Number(s): SAND-90-1845C; CONF-900723--15; ON: DE90015697
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360605 -- Materials-- Radiation Effects
42 ENGINEERING
426000* -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200 -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
45 MILITARY TECHNOLOGY, WEAPONRY, AND NATIONAL DEFENSE
450500 -- Military Technology
Weaponry
& National Defense-- Strategic Defense Initiative-- (1990-)
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
BALLISTIC MISSILE DEFENSE
COST BENEFIT ANALYSIS
DOSE RATES
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
EXTRAPOLATION
FEEDBACK
FUNCTIONS
HARDENING
IMPLEMENTATION
INTEGRATED CIRCUITS
MANUFACTURERS
MATHEMATICAL MODELS
MEMORY DEVICES
MICROELECTRONIC CIRCUITS
NATIONAL DEFENSE
NUMERICAL SOLUTION
PERFORMANCE TESTING
PHYSICAL RADIATION EFFECTS
QUALITY ASSURANCE
RADIATION EFFECTS
RADIATION HARDENING
REGULATIONS
RESPONSE FUNCTIONS
SENSITIVITY
SHIELDING
STANDARDS
STATISTICAL MODELS
TECHNOLOGY ASSESSMENT
TESTING
VALIDATION
VARIATIONS
VIOLATIONS
VULNERABILITY