Wafer-level radiation testing for hardness assurance
Conference
·
OSTI ID:5753244
- Sandia National Labs., Albuquerque, NM (USA)
- Mission Research Corp., Albuquerque, NM (USA)
A wafer-level test system, capable of 50-MHz data rates, is shown to support (1) process improvement and control and (2) test-structure-to-IC correlation efforts for total-dose hardness assurance. 11 refs., 3 figs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- Sponsoring Organization:
- DOD; Department of Defense, Washington, DC (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 5753244
- Report Number(s):
- SAND-91-0449C; CONF-910751--8; ON: DE91009188
- Country of Publication:
- United States
- Language:
- English
Similar Records
Wafer-level radiation testing for hardness assurance
Implementing QML (Qualified Manufacturers List) for radiation hardness assurance
Implementing QML for radiation hardness assurance
Conference
·
Sat Nov 30 23:00:00 EST 1991
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:5832611
Implementing QML (Qualified Manufacturers List) for radiation hardness assurance
Conference
·
Sun Dec 31 23:00:00 EST 1989
·
OSTI ID:6727928
Implementing QML for radiation hardness assurance
Conference
·
Fri Nov 30 23:00:00 EST 1990
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA)
·
OSTI ID:5767713