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Characterization of Y-Ba-Cu-O thin films and yttria-stabilized zirconia intermediate layers on metal alloys grown by pulsed laser deposition

Journal Article · · Applied Physics Letters; (USA)
DOI:https://doi.org/10.1063/1.105329· OSTI ID:5743137
; ;  [1]
  1. Lawrence Berkeley Laboratory, Applied Science Division, Berkeley, California 94720 (US)
The use of an intermediate layer is necessary for the growth of YBaCuO thin films on polycrystalline metallic alloys for tape conductor applications. A pulsed laser deposition process to grow controlled-orientation yttria-stabilized zirconia (YSZ) films as intermediate layers on Haynes Alloy No. 230 was developed and characterized. YBaCuO films deposited on these YSZ-coated substrates are primarily {ital c}-axis oriented and superconducting as deposited. The best YBaCuO films grow on (001) oriented YSZ intermediate layers and have {ital T}{sub {ital c}} ({ital R}=0) = 86.0 K and {ital J}{sub {ital c}} {similar to} 3{times}10{sup 3} A/cm{sup 2} at 77 K.
DOE Contract Number:
AC03-76SF00098
OSTI ID:
5743137
Journal Information:
Applied Physics Letters; (USA), Journal Name: Applied Physics Letters; (USA) Vol. 59:6; ISSN APPLA; ISSN 0003-6951
Country of Publication:
United States
Language:
English