skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Nucleation of epitaxial yttria-stabilized zirconia on biaxially textured (001) Ni for deposited conductors

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.126365· OSTI ID:20216001
 [1];  [1];  [1];  [1];  [1];  [2];  [2]
  1. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056 (United States)
  2. Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116 (United States)

The nucleation of (001)-oriented yttria-stabilized zirconia (YSZ) directly on the (001) Ni surface is realized via nucleation on an oxygen-terminated nickel surface using pulsed-laser deposition. Under conditions where the nickel surface is either oxygen free or substantially covered with NiO, a mixed orientation of YSZ occurs. The epitaxial YSZ layer grown on a biaxially textured Ni(001) surface was used as a single buffer layer for a high temperature superconducting coated conductor architecture, yielding superconducting YBa{sub 2}Cu{sub 3}O{sub 7} films with high critical current densities, J{sub c}. This architecture eliminates the necessity for a multilayer buffer architecture, since high J{sub c} superconducting films are achieved with no intermediate buffer layer between the (001) YSZ and the biaxially textured metal. (c) 2000 American Institute of Physics.

OSTI ID:
20216001
Journal Information:
Applied Physics Letters, Vol. 76, Issue 17; Other Information: PBD: 24 Apr 2000; ISSN 0003-6951
Country of Publication:
United States
Language:
English