Nucleation of epitaxial yttria-stabilized zirconia on biaxially textured (001) Ni for deposited conductors
- Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6056 (United States)
- Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6116 (United States)
The nucleation of (001)-oriented yttria-stabilized zirconia (YSZ) directly on the (001) Ni surface is realized via nucleation on an oxygen-terminated nickel surface using pulsed-laser deposition. Under conditions where the nickel surface is either oxygen free or substantially covered with NiO, a mixed orientation of YSZ occurs. The epitaxial YSZ layer grown on a biaxially textured Ni(001) surface was used as a single buffer layer for a high temperature superconducting coated conductor architecture, yielding superconducting YBa{sub 2}Cu{sub 3}O{sub 7} films with high critical current densities, J{sub c}. This architecture eliminates the necessity for a multilayer buffer architecture, since high J{sub c} superconducting films are achieved with no intermediate buffer layer between the (001) YSZ and the biaxially textured metal. (c) 2000 American Institute of Physics.
- OSTI ID:
- 20216001
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 17 Vol. 76; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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