(Chemical probes of charge transfer at semiconductor/liquid junctions). Technical report for May 15, 1984-January 15, 1985
Technical Report
·
OSTI ID:5738618
A study of the effects of surface energetics and surface oxide layers on the cyclic voltametry of metallocenes at nonilluminated p- and n-InP electrodes has been completed. Nearly ideal semiconductor/solution interfaces can be prepared, it was concluded, and the voltammetry of metallocenes is a way to probe electron transfer across this interface under different surface energetic conditions. Single crystals of WSe/sub 2/ were grown by chemical vapor transport. A computer program was written to collect voltametric data and calculated convoluted currents, and it is used to examine the kinetics of charge transfer across the semiconductor solution interface. (LEW)
- Research Organization:
- Colorado Univ., Boulder (USA)
- DOE Contract Number:
- FG02-84ER13247
- OSTI ID:
- 5738618
- Report Number(s):
- DOE/ER/13247-1; ON: DE85013082
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400400* -- Electrochemistry
CAPACITANCE
CHALCOGENIDES
CHARGE TRANSPORT
CHEMICAL COATING
CHEMICAL VAPOR DEPOSITION
DATA ACQUISITION
DEPOSITION
ELECTRICAL PROPERTIES
ELECTROCHEMICAL CELLS
INDIUM COMPOUNDS
INDIUM PHOSPHIDES
OXIDES
OXYGEN COMPOUNDS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
PROBES
REFRACTORY METAL COMPOUNDS
SELENIDES
SELENIUM COMPOUNDS
SURFACE COATING
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN COMPOUNDS
TUNGSTEN SELENIDES
VOLTAMETRY
400400* -- Electrochemistry
CAPACITANCE
CHALCOGENIDES
CHARGE TRANSPORT
CHEMICAL COATING
CHEMICAL VAPOR DEPOSITION
DATA ACQUISITION
DEPOSITION
ELECTRICAL PROPERTIES
ELECTROCHEMICAL CELLS
INDIUM COMPOUNDS
INDIUM PHOSPHIDES
OXIDES
OXYGEN COMPOUNDS
PHOSPHIDES
PHOSPHORUS COMPOUNDS
PHYSICAL PROPERTIES
PNICTIDES
PROBES
REFRACTORY METAL COMPOUNDS
SELENIDES
SELENIUM COMPOUNDS
SURFACE COATING
TRANSITION ELEMENT COMPOUNDS
TUNGSTEN COMPOUNDS
TUNGSTEN SELENIDES
VOLTAMETRY