Rad-hard electronics study for SSC detectors
The radiation environment in a SSC detector operating at a luminosity of 10{sup 33} cm{sup {minus}2}s{sup {minus}1} will put stringent requirements on radiation hardness of the electronics. Over the expected 10 year life-time of a large detector, ionizing radiation doses of up to 20 MRad and neutron fluences of 10{sup 16} neutrons/cm{sup 2} are projected. At a luminosity of 10{sup 34} cm{sup {minus}2}s{sup {minus}1} even higher total doses are expected. the effect of this environment have been simulated by exposing CMOS/bulk and CMOS/SOS devices from monolithic processes to neutrons and ionizing radiation. leakage currents, noise variations, and DC characteristics have been measured before and after exposure in order to evaluate the effects of the irradiations. As expected the device characteristics remained virtually unchanged by neutron irradiation, while ionizing radiation caused moderate degradation of performance. 5 refs., 6 figs.
- Research Organization:
- Argonne National Lab., IL (United States)
- Sponsoring Organization:
- DOE; USDOE, Washington, DC (USA)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 5731583
- Report Number(s):
- ANL-HEP-CP-91-33; CONF-910340--45; ON: DE91015200
- Country of Publication:
- United States
- Language:
- English
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430303 -- Particle Accelerators-- Experimental Facilities & Equipment
440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
440200 -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DAMAGING NEUTRON FLUENCE
ELECTRONIC EQUIPMENT
EQUIPMENT
FIELD EFFECT TRANSISTORS
HARDENING
MEASURING INSTRUMENTS
MEASURING METHODS
MOS TRANSISTORS
MOSFET
NEUTRON FLUENCE
NEUTRON SPECTRA
PHYSICAL RADIATION EFFECTS
RADIATION DETECTORS
RADIATION EFFECTS
RADIATION HARDENING
SEMICONDUCTOR DEVICES
SHOWER COUNTERS
SPECTRA
STORAGE RINGS
SUPERCONDUCTING SUPER COLLIDER
TRANSISTORS