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Title: Energy relaxation of light holes in InAs/sub. 15/Sb/sub. 85//InSb multiple quantum wells

Conference ·
OSTI ID:5724072

The energy relaxation rate of light in-plane in InAs/sub .15/Sb/sub .85//InSb quantum wells has been measured using a Shubnikov-de Haas technique. In this Type II system, the holes reside in the InSb layers; strain reverses the heavy-light hole ordering and thus light holes are the charge carriers. The samples consist of 20 to 100 InAs/sub .15/Sb/sub .85//InSb periods 100/angstrom//200/angstrom/ thick. The InAsSb barriers are doped with Be. The total carrier concentration is obtained from Hall data. Shubnikov-de Haas oscillation amplitudes are measured and used to determine the light hole temperature for a given applied power. The steady state power per carrier is equated to the energy relaxation rate to determine the carrier temperature T/sub H/. Data are compared with theory and experiment for light holes in InGaAs/GaAs quantum wells. 17 refs., 5 figs.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
5724072
Report Number(s):
SAND-89-1875C; CONF-8907133-1; ON: DE89016035
Resource Relation:
Conference: 6. international conference on hot carriers in semiconductors, Scottsdale, AZ, USA, 23-28 Jul 1989; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English