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The effect of coimplantation on the electrical activity of implanted carbon in GaAs

Journal Article · · Journal of Applied Physics; (United States)
DOI:https://doi.org/10.1063/1.355027· OSTI ID:5721049
 [1]; ; ;  [2];  [1]
  1. Center for Advanced Materials, Lawrence Berkeley Laboratory and Materials Science and Mineral Engineering Department, University of California at Berkeley, Berkeley, California 94720 (United States)
  2. Center for Advanced Materials, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)

The effects of radiation damage and stoichiometry on the electrical activity of carbon implanted in GaAs are studied. Damage due to implantation of an ion heavier than C increases the number of C atoms which substitute for As (C[sub As]). Creation of an amorphous layer by implantation and the subsequent solid phase epitaxy during annealing further enhances the concentration of C[sub As]. However, the free carrier concentration does not increase linearly with increasing concentration of C[sub As] due to compensating defects. Activation of implanted C is maximized by maintaining the stoichiometry of the substrate which reduces the number of compensating defects in the crystal. Under optimum conditions for carbon implanted at a dose of 5[times]10[sup 14] cm[sup [minus]2], the carbon acceptor activity can be increased from 2% to 65% of the total implanted carbon.

DOE Contract Number:
AC03-76SF00098
OSTI ID:
5721049
Journal Information:
Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 74:12; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English

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